A New Semi-Supervised Deep Learning Approach for Intelligent Defects Recognition.

Yiping Gao Liang Gao Xinyu Li

Published in: ICNSC (2020)

Keyphrases

deep learning
unsupervised learning
object recognition
machine learning
mental models
unsupervised feature learning
pattern recognition
feature extraction
restricted boltzmann machine
weakly supervised
bayesian networks
text classification
action recognition