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Investigation of temperature variations on analog/RF and linearity performance of stacked gate GEWE-SiNW MOSFET for improved device reliability.
Neha Gupta
Rishu Chaujar
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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field effect transistors
signal processing
radio frequency
data sets
neural network
low cost
improved algorithm
data conversion
temperature control