On the Design of Reliable 3D-ICs Considering Charged Device Model ESD Events During Die Stacking.

Duckhwan Kim Saibal Mukhopadhyay

Published in: DAC (2014)

Keyphrases

computational model
data sets
high level
management system
conceptual framework
objective function
design process
statistical model
neural network model
genetic algorithm
case study
prior knowledge
probabilistic model
metamodel
modelling language
model averaging