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Determining the operator-machine assignment for machine interference problem and an empirical study in semiconductor test facility.

Chen-Fu ChienJia-Nian ZhengYi-Jay Lin
Published in: J. Intell. Manuf. (2014)
Keyphrases
  • wafer fabrication
  • data sets
  • real world
  • artificial intelligence
  • neural network
  • learning algorithm
  • similarity measure
  • bayesian networks
  • software development