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An integrated replenishment model with quantity discounts, reentry and downward substitution for control wafers.
He-Yau Kang
Amy H. I. Lee
Chun-Mei Lai
Published in:
J. Intell. Manuf. (2012)
Keyphrases
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computational model
probability distribution
prior knowledge
mathematical model
sensitivity analysis
control structure
high level
statistical model
decision making
mobile robot
probabilistic model
em algorithm
conceptual model
prediction model