Sampling Limits for Electron Tomography with Sparsity-exploiting Reconstructions.
Yi JiangElliot PadgettRobert HovdenDavid A. MullerPublished in: CoRR (2019)
Keyphrases
- image reconstruction
- compressive sampling
- compressed sensing
- electron microscope
- sparsely sampled
- iterative reconstruction
- three dimensional
- sampled data
- compressive sensing
- monte carlo
- sparse representation
- random sampling
- tomographic reconstruction
- noise level
- computed tomography
- parameter space
- structure from motion
- limited angle
- radon transform
- high energy
- x ray
- surface reconstruction
- sample size
- orthogonal matching pursuit
- super resolution
- image quality
- high quality