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Eliminating the Temperature Effect of Piezoelectric Transformer in Backlight Electronic Ballast by Applying the Digital Phase-Locked-Loop Technique.

Chang-Hua LinYing LuHuang-Jen ChiuChung-Lun Ou
Published in: IEEE Trans. Ind. Electron. (2007)
Keyphrases
  • phase locked loop
  • high voltage
  • partial discharge
  • operating conditions
  • normal operation
  • neural network
  • real time
  • genetic algorithm