Comparison of Search-Based Algorithms for Stress-Testing Integrated Circuits.
Basil EljuseNeil WalkinshawPublished in: SSBSE (2018)
Keyphrases
- integrated circuit
- computational complexity
- search space
- worst case
- image processing algorithms
- learning algorithm
- search algorithm
- significant improvement
- exhaustive search
- machine learning algorithms
- search strategies
- optimization problems
- search strategy
- combinatorial optimization
- orders of magnitude
- data sets
- image processing
- neural network