Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.

Melanie Po-Leen Ooi Ye Chow Kuang Chris Chan Serge N. Demidenko

Published in: DELTA (2008)

Keyphrases

mobile devices
higher level
modeling language
database
data mining
image processing
three dimensional
search algorithm
low level
mobile phone
context aware
embedded systems
modeling framework
deep learning