Whole mirror duplication-random loss model and pattern avoiding permutations.

Jean-Luc Baril Rémi Vernay

Published in: Inf. Process. Lett. (2010)

Keyphrases

probabilistic model
statistical model
machine learning
artificial neural networks
process model
hierarchical structure
data sets
knowledge base
high level
objective function
pairwise
input data
computational model
experimental data
formal model
autoregressive