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Corrosion and protection of thin-line conductors in VLSI structures.
Vlasta Brusic
Gerald S. Frankel
Chao-Kyn Hu
Miro M. Plechaty
Geraldine Cogin Schwartz
Published in:
IBM J. Res. Dev. (1993)
Keyphrases
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data sets
thin film
image processing
pattern recognition
vlsi design
curvilinear structures
real time
artificial intelligence
information systems
low cost
signal processing
line segments
complex structures
protection scheme