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Design and Analysis of SRAM Cell using Negative Bit-Line Write Assist Technique and Separate Read Port for High-Speed Applications.

Jitendra Kumar MishraLakshmi Likhitha MankaliKavindra KandpalPrasanna Kumar MisraManish Goswami
Published in: J. Circuits Syst. Comput. (2021)
Keyphrases
  • high speed
  • statistical analysis
  • case study
  • building blocks
  • engineering design
  • data sets
  • data analysis
  • design principles
  • database management systems
  • line segments
  • positive and negative
  • file system
  • low power