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Interconnect Delay Model for Wide Supply Voltage Range Repeater Insertion in Sub-22 nm FinFET Technologies.
Alexander E. Shapiro
Eby G. Friedman
Published in:
J. Low Power Electron. (2017)
Keyphrases
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computational model
experimental data
statistical model
wide range
cost function
real time
probabilistic model
high speed
mathematical model
theoretical analysis
finite state machines
formal model
conceptual model
input data
similarity measure
high level
image segmentation
decision trees
data mining