From statistical model checking to statistical model inference: characterizing the effect of process variations in analog circuits.
Yan ZhangSriram SankaranarayananFabio SomenziXin ChenErika ÁbrahámPublished in: ICCAD (2013)
Keyphrases
- statistical model
- model checking
- statistical models
- analog circuits
- temporal logic
- statistical distribution
- formal verification
- symbolic model checking
- model checker
- epistemic logic
- formal specification
- active appearance models
- timed automata
- verification method
- temporal properties
- artificial intelligence
- computation tree logic
- automated verification
- knowledge acquisition