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Impact of P/E cycling on read current fluctuation of NOR Flash memory cell: A microscopic perspective based on low frequency noise analysis.

Xiaonan YangJing LiuZhiwei ZhengYan WangDandan JiangShengfen ChiuHanming WuMing Liu
Published in: IRPS (2015)
Keyphrases
  • low frequency
  • high frequency
  • image analysis
  • wavelet transform
  • frequency domain
  • flash memory
  • data analysis
  • real time
  • similarity measure
  • subband
  • discrete wavelet transform