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International organization in electromagnetic metrology and international comparison of RF and microwave standards.
A. Earle Bailey
Helmut W. Hellwig
Toshio Nemoto
Sogo Okamura
Published in:
Proc. IEEE (1986)
Keyphrases
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international standard
widely accepted
real time
computer science
long lasting
machine learning
information systems
decision making
world wide
management science
intelligence and security informatics
international competition