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Influence of Ohmic Contact Resistance on Transconductance in AlGaN/GaN HEMT.

Yoshikazu HiroseAkira HonshioTakeshi KawashimaMotoaki IwayaSatoshi KamiyamaMichinobu TsudaHiroshi AmanoIsamu Akasaki
Published in: IEICE Trans. Electron. (2006)
Keyphrases
  • integrated circuit
  • information systems
  • case study
  • image analysis
  • neural network
  • similarity measure
  • bayesian networks
  • hidden markov models
  • individual differences
  • electric field
  • main factors