Error free sense amplifier circuit design for STT-MRAM nonvolatile memory.

Lohith Kumar Vemula Nahid M. Hossain Masud H. Chowdhury

Published in: MWSCAS (2017)

Keyphrases

error free
circuit design
random access memory
error prone
design considerations
flash memory
error resilient
main memory
high quality
motion estimation
transform domain
dynamic range