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Error free sense amplifier circuit design for STT-MRAM nonvolatile memory.

Lohith Kumar VemulaNahid M. HossainMasud H. Chowdhury
Published in: MWSCAS (2017)
Keyphrases
  • error free
  • circuit design
  • random access memory
  • error prone
  • design considerations
  • flash memory
  • error resilient
  • main memory
  • high quality
  • motion estimation
  • transform domain
  • dynamic range