Mixed Pattern Recognition Methodology on Wafer Maps with Pre-trained Convolutional Neural Networks.

Yunseon Byun Jun-Geol Baek

Published in: ICAART (2) (2020)

Keyphrases

pre trained
pattern recognition
convolutional neural networks
control signals
neural network
signal processing
machine learning
feature extraction
training data
wide range
image processing
training examples
data sets
computer vision
multiresolution
convolutional network