New substrate-triggered ESD protection structures in a 0.18-µm CMOS process without extra mask.

Yi Shan John He Wen Huang

Published in: Microelectron. Reliab. (2009)

Keyphrases

real world
neural network
machine learning
computer vision
image processing
three dimensional
operating system
databases
data mining
structural features
data protection
magnetic recording
protection scheme
fractional differential