Login / Signup

Comparative investigation of optical and structural properties of porous SiC.

M. Morales RodríguezJ. M. RivasA. I. Diaz CanoT. V. TorchynskaJ. Palacios GomezG. G. GasgaSergio Jiménez-SandovalM. Mynbaeva
Published in: Microelectron. J. (2008)
Keyphrases
  • structural properties
  • topological properties
  • tree width
  • network evolution
  • clustering coefficient
  • data sets
  • neural network
  • shortest path
  • fiber optic