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Accurate Substrate Analysis Based on a Novel Finite Difference Method via Synchronization Method on Layered and Adaptive Meshing.

Youngae HanJinsong Zhao
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
  • support vector machine
  • theoretical analysis
  • similarity measure
  • finite difference method
  • object recognition
  • feature space
  • high order
  • optimization method
  • numerical methods