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Accurate Substrate Analysis Based on a Novel Finite Difference Method via Synchronization Method on Layered and Adaptive Meshing.
Youngae Han
Jinsong Zhao
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
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support vector machine
theoretical analysis
similarity measure
finite difference method
object recognition
feature space
high order
optimization method
numerical methods