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Complex impedance measurement front-end based on an on/off lock-in amplifier.

Ernesto Serrano-FinettiGemma HorneroOscar Casas
Published in: MetroInd4.0& IoT (2022)
Keyphrases
  • high level
  • data sets
  • computer vision
  • e learning
  • complex systems
  • database
  • neural network
  • real world
  • data mining
  • machine learning
  • concurrency control
  • computationally intensive