Automatic detection of Mura defect in TFT-LCD based on regression diagnostics.

Shu-Kai S. Fan Yu-Chiang Chuang

Published in: Pattern Recognit. Lett. (2010)

Keyphrases

automatic detection
liquid crystal displays
tft lcd
thin film transistor
image formation
motion blur
high resolution
eye tracking
higher resolution
goal programming
thin film
image processing
multiresolution
high quality
video sequences
display devices