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Automotive Reliable Memories Integrated into an Ultra-Low Power 40 nm CMOS Logic Process.

S. BadrudduzaG. AbelnT. JewP. GrudowskiA. RoyC. Cavins
Published in: J. Low Power Electron. (2018)
Keyphrases
  • ultra low power
  • development process
  • low power
  • software engineering
  • high speed
  • hardware and software