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Triple Patterning Aware Detailed Placement Toward Zero Cross-Row Middle-of-Line Conflict.
Yibo Lin
Bei Yu
Biying Xu
David Z. Pan
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
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conflict resolution
databases
real world
decision making
resolving conflicts
information retrieval
metadata
image processing
multimedia
bayesian networks
wide range
relational databases
line segments