WaferSegClassNet - A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects.
Subhrajit NagDhruv MakwanaR. Sai Chandra TejaSparsh MittalC. Krishna MohanPublished in: CoRR (2022)
Keyphrases
- lightweight
- wireless sensor networks
- semiconductor manufacturing
- pattern recognition
- classification accuracy
- communication infrastructure
- text classification
- pixel classification
- region growing
- level set
- feature space
- support vector machine
- feature selection
- decision trees
- image segmentation
- computer networks
- network traffic
- multiscale
- image classification
- medical images
- support vector machine svm
- segmentation method
- features extraction
- feature vectors
- machine learning
- complex networks
- neural network
- communication networks
- object segmentation
- automatic recognition
- sensor networks
- network topologies