DFM Evaluation Using IC Diagnosis Data.
Ronald Shawn BlantonFa WangCheng XuePranab K. NagYang XueXin LiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
- raw data
- data analysis
- input data
- data sets
- complex data
- synthetic data
- data collection
- database
- noisy data
- training data
- data distribution
- application domains
- data mining techniques
- original data
- high dimensional data
- statistical analysis
- small number
- data points
- data sources
- xml documents
- high quality
- information retrieval
- data processing
- image data
- knowledge discovery
- missing data
- prior knowledge
- high dimensional
- data objects
- information systems
- historical data