Computational comparison of prediction future lifetime of electronic components with Pareto distribution based on multiply type II censored samples.
Jong-Wuu WuWen-Chuan LeeSheau-Chiann ChenPublished in: Appl. Math. Comput. (2007)
Keyphrases
- type ii
- type i error
- predicting future
- prediction accuracy
- data sets
- sample set
- survival analysis
- long term
- multi objective
- multiobjective optimization
- prediction error
- random samples
- prediction model
- statistical analysis
- random variables
- training samples
- probability distribution
- prediction algorithm
- energy consumption
- neyman pearson
- multicriteria optimization
- machine learning