Login / Signup

Electromagnetic susceptibility characterization of double SOI device.

B. LiK. ZhaoJanfei WuX. ZhaoJ. SuJ. GaoC. GaoJun Luo
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • silicon on insulator
  • high frequency
  • portable devices
  • database
  • artificial intelligence
  • image processing
  • neural network
  • force feedback
  • electronic devices
  • simulation software
  • axiomatic characterization