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A small-baseline approach for investigating deformations on full-resolution differential SAR interferograms.

Riccardo LanariOscar MoraMichele ManuntaJordi J. MallorquíPaolo BerardinoEugenio Sansosti
Published in: IEEE Trans. Geosci. Remote. Sens. (2004)
Keyphrases
  • small number
  • relative improvement
  • multiresolution
  • neural network
  • computer vision
  • multiscale
  • high resolution
  • deformable models
  • sampling rate