Non-resistance metric based read scheme for multi-level PCRAM in 25 nm technology.

Junho Cheon Insoo Lee Changyong Ahn Milos Stanisavljevic Aravinthan Athmanathan Nikolaos Papandreou Haris Pozidis Evangelos Eleftheriou Min-Chul Shin Taekseung Kim Jong-Ho Kang Jun Hyun Chun

Published in: CICC (2015)

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