A Fast Logic Mapping Algorithm for Multiple-Type-Defect Tolerance in Reconfigurable Nano-Crossbar Arrays.
Onur TunaliMustafa AltunPublished in: IEEE Trans. Emerg. Top. Comput. (2019)
Keyphrases
- worst case
- detection algorithm
- computational complexity
- preprocessing
- cost function
- learning algorithm
- high accuracy
- computationally efficient
- objective function
- search space
- significant improvement
- times faster
- optimization algorithm
- path planning
- parallel implementation
- convergence rate
- improved algorithm
- theoretical analysis
- expectation maximization
- experimental evaluation
- dynamic programming
- clustering method
- recognition algorithm