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"Sweet Spots" in Moderate Inversion for MOSFET Squarer Transconductors.

Peter J. LangloisAndreas Demosthenous
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2007)
Keyphrases
  • image reconstruction
  • real time
  • information technology
  • data sets
  • feature extraction
  • multiresolution
  • laplace transform
  • neural network
  • data mining
  • high level
  • control system
  • emission tomography
  • spot detection