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Improved Optoelectronic Technique for the Time-Domain Characterization of Sampling Oscilloscopes.

Mark BielerMeinhard SpitzerKlaus PierzUwe Siegner
Published in: IEEE Trans. Instrum. Meas. (2009)
Keyphrases
  • frequency domain
  • databases
  • machine learning
  • image processing
  • parameter space
  • computer vision
  • monte carlo
  • sampling strategy