Login / Signup

Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.

Jae-Seong JeongSoon-Ha HongSang-Deuk Park
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • databases
  • website
  • data intensive
  • neural network
  • data mining
  • image processing
  • high resolution
  • computational model
  • failure prediction