Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash Memory.
Gilsang YoonDongHyun KoJounghun ParkDonghwi KimJungsik KimJeong-Soo LeePublished in: IEEE Access (2022)
Keyphrases
- flash memory
- garbage collection
- solid state
- random access
- main memory
- file system
- buffer management
- embedded systems
- disk drives
- b tree
- data storage
- database systems
- hand held devices
- storage devices
- small size
- memory management
- storage systems
- database
- storage management
- frequent itemsets
- query processing
- feature space
- data structure