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Characterization of n-channel MOSFETs: Electrical measurements and simulation analysis.

Viktoryia UhnevionakChristian StrengerAlexander BurenkovV. MortetElena Bedel-PereiraJürgen LorenzPeter Pichler
Published in: ESSDERC (2013)
Keyphrases
  • mathematical analysis
  • real time
  • neural network
  • information systems
  • image analysis
  • numerical analysis
  • data analysis
  • artificial neural networks
  • quantitative analysis
  • simulation environment
  • simulation models