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Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.

Calvin Yi-Ping ChaoThomas Meng-Hsiu WuShang-Fu YehChih-Lin LeeHonyih TuJoey Chiao-Yi HuangChin-Hao Chang
Published in: Sensors (2023)
Keyphrases
  • cmos image sensor
  • signal to noise ratio
  • dynamic range
  • image analysis
  • small size