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Research on a Multi-Level Combination of Software Defect Localization Method.

Peng WangChun ShanShanshan MeiNing Li
Published in: SmartWorld/SCALCOM/UIC/ATC/CBDCom/IOP/SCI (2019)
Keyphrases
  • feature representation
  • localization method
  • software defect
  • feature extraction
  • software defect prediction
  • pairwise
  • high confidence
  • image processing
  • training samples
  • machine learning methods
  • confidence estimates