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The IEEE Technical Committee 10: The Waveform Generation, Measurement, and Analysis Committee.

Luca De VitoJohn R. JendzurskiSergio RapuanoWilliam B. BoyerJerome J. BlairNicholas G. Paulter
Published in: IEEE Instrum. Meas. Mag. (2021)
Keyphrases
  • information systems
  • image analysis
  • quantitative analysis
  • neural network
  • search engine
  • database systems
  • committee members