Defect Analysis over Multiple Release Versions of a Semiconductor Software System.

Eric Abuta Jeff Tian

Published in: COUFLESS@ICSE (2015)

Keyphrases

neural network
quantitative analysis
statistical analysis
data mining
software tools
data analysis
image processing
information systems
computer vision
multi agent
artificial neural networks
user interface
image analysis
computer systems
genetic algorithm
real world
real time