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Distinct Feature Labeling Methods for SVM-Based AMD Automated Detector on 3D OCT Volumes.

Yao-Wen YuCheng-Hung LinCheng-Kai LuJia-Kang WangTzu-Lun Huang
Published in: ICCE (2022)
Keyphrases
  • three dimensional
  • significant improvement
  • support vector machine
  • empirical studies
  • computational cost
  • benchmark datasets
  • machine learning
  • image processing
  • image segmentation
  • statistical methods
  • object detectors