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Trade-off analysis of the p-base doping on ruggedness of SiC MOSFETs.

Bhagyalakshmi KakarlaSelamnesh NidaJohanna MuetingThomas ZiemannIvana Kovacevic-BadstuebnerUlrike Grossner
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • trade off
  • data analysis
  • data structure
  • statistical analysis
  • databases
  • neural network
  • machine learning
  • three dimensional
  • high level
  • natural language
  • image analysis
  • multiresolution
  • quantitative analysis