Critical Gates Identification for Fault-Tolerant Design in Math Circuits.

Tian Ban Gutemberg G. S. Junior

Published in: J. Electr. Comput. Eng. (2017)

Keyphrases

fault tolerant
fault tolerance
logic circuits
distributed systems
design process
load balancing
safety critical
data structure
database
high availability
analog circuits
evolvable hardware
logic synthesis
high level synthesis