Accelerated Destructive Degradation Tests Robust to Distribution Misspecification.

Shuen-Lin Jeng Bei-Ying Huang William Q. Meeker

Published in: IEEE Trans. Reliab. (2011)

Keyphrases

data structure
least squares
parameter tuning
uniformly distributed
image noise
robust optimization
real world
data mining
computer vision
feature extraction
computationally efficient
random variables
highly accurate