A novel efficient TSV built-in test for stacked 3D ICs.

Badi Guibane Belgacem Hamdi Brahim Bensalem Abdellatif Mtibaa

Published in: Turkish J. Electr. Eng. Comput. Sci. (2018)

Keyphrases

cost effective
efficient implementation
data mining
machine learning
computer vision
feature selection
face recognition
objective function
association rules
hidden markov models
lightweight