Editorial for Special Issue "Fine Art Pattern Extraction and Recognition".

Fabio Bellavia Giovanna Castellano Gennaro Vessio

Published in: J. Imaging (2021)

Keyphrases

special issue
pattern extraction
international journal
ai edam
ecml pkdd
object recognition
applied intelligence
special section
post processing
feature extraction
action recognition
recognition algorithm
text mining
expert systems
data sets
high resolution
multiresolution
databases