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A new morphology-based approach for similarity searching on wafer bin maps in semiconductor manufacturing.
Tsung-Jung Hsieh
Chung-Shou Liao
Yu-Syuan Huang
Chen-Fu Chien
Published in:
CSCWD (2012)
Keyphrases
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semiconductor manufacturing
similarity searching
similarity search
metric space
discrete event simulation
process control
chemical structures
virtual screening
multimedia databases
access methods
search tools
production system
similarity queries
similarity measure
distance function
knn
control system