A non-invasive method to extract the junction temperature of IGBT.
Rajashree BiswasAurobinda RoutrayShuvam ChakrabortyPublished in: IECON (2019)
Keyphrases
- experimental evaluation
- high precision
- preprocessing
- pairwise
- significant improvement
- multiscale
- matching algorithm
- detection method
- support vector machine svm
- main contribution
- theoretical analysis
- computationally efficient
- input data
- high accuracy
- prior knowledge
- objective function
- neural network
- support vector machine
- knn
- computational cost
- dynamic programming
- mathematical model